Security Advisory
CVE-2017-18696
9.8
CRITICAL
Vulnerability Description
An issue was discovered on Samsung mobile devices with M(6.0) and N(7.0) (Exynos7420, Exynos8890, or MSM8996 chipsets) software. RKP allows memory corruption. The Samsung ID is SVE-2016-7897 (January 2017).
Published Date
April 7, 2020
Official Source
NIST NVD Advisory